Two-dimensional Synchrotron Beam Characterisation from a Single Interferogram

Fuente: arXiv
Guardado en:
Detalles Bibliográficos
Autores principales: Nikolic, Bojan, Carilli, Christopher L., Thyagarajan, Nithyanandan, Torino, Laura, Iriso, Ubaldo
Formato: Preprint
Publicado: 2024
Materias:
Acceso en línea:
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
_version_ 1866916497248485376
author Nikolic, Bojan
Carilli, Christopher L.
Thyagarajan, Nithyanandan
Torino, Laura
Iriso, Ubaldo
author_facet Nikolic, Bojan
Carilli, Christopher L.
Thyagarajan, Nithyanandan
Torino, Laura
Iriso, Ubaldo
contents Double-aperture Young interferometry is widely used in accelerators to provide a one-dimensional beam measurement. We improve this technique by combining and further developing techniques of non-redundant, two-dimensional, aperture masking and self-calibration from astronomy. Using visible synchrotron radiation, tests at the ALBA synchrotron show that this method provides an accurate two-dimensional beam transverse characterisation, even from a single 1 ms interferogram. The non-redundancy of the aperture mask in the technique enables it to be resistant to spatial phase fluctuations that might be introduced by vibration of optical components, or in the laboratory atmosphere.
format Preprint
id arxiv_https___arxiv_org_abs_2405_12090
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Two-dimensional Synchrotron Beam Characterisation from a Single Interferogram
Nikolic, Bojan
Carilli, Christopher L.
Thyagarajan, Nithyanandan
Torino, Laura
Iriso, Ubaldo
Accelerator Physics
Instrumentation and Methods for Astrophysics
Optics
Double-aperture Young interferometry is widely used in accelerators to provide a one-dimensional beam measurement. We improve this technique by combining and further developing techniques of non-redundant, two-dimensional, aperture masking and self-calibration from astronomy. Using visible synchrotron radiation, tests at the ALBA synchrotron show that this method provides an accurate two-dimensional beam transverse characterisation, even from a single 1 ms interferogram. The non-redundancy of the aperture mask in the technique enables it to be resistant to spatial phase fluctuations that might be introduced by vibration of optical components, or in the laboratory atmosphere.
title Two-dimensional Synchrotron Beam Characterisation from a Single Interferogram
topic Accelerator Physics
Instrumentation and Methods for Astrophysics
Optics
url https://arxiv.org/abs/2405.12090