Quantifying the local mechanical properties of twisted double bilayer graphene
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arXiv
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| Main Authors: | , , , , , , , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
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| _version_ | 1866917672335179776 |
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| author | Canetta, Alessandra Gonzalez-Munoz, Sergio Nguyen, Viet-Hung Agarwal, Khushboo de Picquendaele, Pauline de Crombrugghe Hong, Yuanzhuo Mohapatra, Sambit Watanabe, Kenji Taniguchi, Takashi Nysten, Bernard Hackens, Benoît Ribeiro-Palau, Rebeca Charlier, Jean-Christophe Kolosov, Oleg Spièce, Jean Gehring, Pascal |
| author_facet | Canetta, Alessandra Gonzalez-Munoz, Sergio Nguyen, Viet-Hung Agarwal, Khushboo de Picquendaele, Pauline de Crombrugghe Hong, Yuanzhuo Mohapatra, Sambit Watanabe, Kenji Taniguchi, Takashi Nysten, Bernard Hackens, Benoît Ribeiro-Palau, Rebeca Charlier, Jean-Christophe Kolosov, Oleg Spièce, Jean Gehring, Pascal |
| contents | Nanomechanical measurements of minimally twisted van der Waals materials remained elusive despite their fundamental importance for device realisation. Here, we use Ultrasonic Force Microscopy (UFM) to locally quantify the variation of out-of-plane Young's modulus in minimally twisted double bilayer graphene (TDBG). We reveal a softening of the Young's modulus by 7\% and 17\% along single and double domain walls, respectively. Our experimental results are confirmed by force-field relaxation models. This study highlights the strong tunability of nanomechanical properties in engineered twisted materials, and paves the way for future applications of designer 2D nanomechanical systems. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2405_12610 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Quantifying the local mechanical properties of twisted double bilayer graphene Canetta, Alessandra Gonzalez-Munoz, Sergio Nguyen, Viet-Hung Agarwal, Khushboo de Picquendaele, Pauline de Crombrugghe Hong, Yuanzhuo Mohapatra, Sambit Watanabe, Kenji Taniguchi, Takashi Nysten, Bernard Hackens, Benoît Ribeiro-Palau, Rebeca Charlier, Jean-Christophe Kolosov, Oleg Spièce, Jean Gehring, Pascal Mesoscale and Nanoscale Physics Nanomechanical measurements of minimally twisted van der Waals materials remained elusive despite their fundamental importance for device realisation. Here, we use Ultrasonic Force Microscopy (UFM) to locally quantify the variation of out-of-plane Young's modulus in minimally twisted double bilayer graphene (TDBG). We reveal a softening of the Young's modulus by 7\% and 17\% along single and double domain walls, respectively. Our experimental results are confirmed by force-field relaxation models. This study highlights the strong tunability of nanomechanical properties in engineered twisted materials, and paves the way for future applications of designer 2D nanomechanical systems. |
| title | Quantifying the local mechanical properties of twisted double bilayer graphene |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2405.12610 |