Machine Learning Force Field for Thermal Oxidation of Silicon

Fuente: arXiv
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Main Authors: Cvitkovich, Lukas, Fehringer, Franz, Wilhelmer, Christoph, Milardovich, Diego, Waldhör, Dominic, Grasser, Tibor
Format: Preprint
Published: 2024
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_version_ 1866913565191962624
author Cvitkovich, Lukas
Fehringer, Franz
Wilhelmer, Christoph
Milardovich, Diego
Waldhör, Dominic
Grasser, Tibor
author_facet Cvitkovich, Lukas
Fehringer, Franz
Wilhelmer, Christoph
Milardovich, Diego
Waldhör, Dominic
Grasser, Tibor
contents Looking back at seven decades of highly extensive application in the semiconductor industry, silicon and its native oxide SiO$_2$ are still at the heart of several technological developments. Recently, the fabrication of ultra-thin oxide layers has become essential for keeping up with trends in down-scaling of nanoelectronic devices and for the realization of novel device technologies. With this comes a need for better understanding of the atomic configuration at the Si/SiO$_2$ interface. Classical force fields offer flexible application and relatively low computational costs, however, suffer from limited accuracy. Ab-initio methods give much better results but are extremely costly. Machine learning force fields (MLFF) offer the possibility to combine the benefits of both worlds. We train a MLFF for the simulation of the dry thermal oxidation process of a Si substrate. The training data is generated by density functional theory calculations. The obtained structures are in line with ab-initio simulations as well as with experimental observations. Compared to a classical force field, the most recent reactive force field (reaxFF), the resulting configurations are vastly improved.
format Preprint
id arxiv_https___arxiv_org_abs_2405_13635
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Machine Learning Force Field for Thermal Oxidation of Silicon
Cvitkovich, Lukas
Fehringer, Franz
Wilhelmer, Christoph
Milardovich, Diego
Waldhör, Dominic
Grasser, Tibor
Materials Science
Looking back at seven decades of highly extensive application in the semiconductor industry, silicon and its native oxide SiO$_2$ are still at the heart of several technological developments. Recently, the fabrication of ultra-thin oxide layers has become essential for keeping up with trends in down-scaling of nanoelectronic devices and for the realization of novel device technologies. With this comes a need for better understanding of the atomic configuration at the Si/SiO$_2$ interface. Classical force fields offer flexible application and relatively low computational costs, however, suffer from limited accuracy. Ab-initio methods give much better results but are extremely costly. Machine learning force fields (MLFF) offer the possibility to combine the benefits of both worlds. We train a MLFF for the simulation of the dry thermal oxidation process of a Si substrate. The training data is generated by density functional theory calculations. The obtained structures are in line with ab-initio simulations as well as with experimental observations. Compared to a classical force field, the most recent reactive force field (reaxFF), the resulting configurations are vastly improved.
title Machine Learning Force Field for Thermal Oxidation of Silicon
topic Materials Science
url https://arxiv.org/abs/2405.13635