Vibrational modes as the origin of dielectric loss at 0.27$\unicode{x2013}$100 THz in a-SiC:H

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Buijtendorp, B. T., Endo, A., Jellema, W., Karatsu, K., Kouwenhoven, K., Lamers, D., van der Linden, A. J., Rostem, K., Veen, M., Wollack, E. J., Baselmans, J. J. A., Vollebregt, S.
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866908367821209600
author Buijtendorp, B. T.
Endo, A.
Jellema, W.
Karatsu, K.
Kouwenhoven, K.
Lamers, D.
van der Linden, A. J.
Rostem, K.
Veen, M.
Wollack, E. J.
Baselmans, J. J. A.
Vollebregt, S.
author_facet Buijtendorp, B. T.
Endo, A.
Jellema, W.
Karatsu, K.
Kouwenhoven, K.
Lamers, D.
van der Linden, A. J.
Rostem, K.
Veen, M.
Wollack, E. J.
Baselmans, J. J. A.
Vollebregt, S.
contents Low-loss deposited dielectrics are beneficial for the advancement of superconducting integrated circuits for astronomy. In the microwave band ($\mathrm{\sim}$1$\unicode{x2013}$10 GHz) the cryogenic and low-power dielectric loss is dominated by two-level systems. However, the origin of the loss in the millimeter-submillimeter band ($\mathrm{\sim}$0.1$\unicode{x2013}$1 THz) is not understood. We measured the loss of hydrogenated amorphous SiC (a-SiC:H) films in the 0.27$\unicode{x2013}$100 THz range using superconducting microstrip resonators and Fourier-transform spectroscopy. The agreement between the loss data and a Maxwell-Helmholtz-Drude dispersion model suggests that vibrational modes above 10 THz dominate the loss in the a-SiC:H above 200 GHz.
format Preprint
id arxiv_https___arxiv_org_abs_2405_13688
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Vibrational modes as the origin of dielectric loss at 0.27$\unicode{x2013}$100 THz in a-SiC:H
Buijtendorp, B. T.
Endo, A.
Jellema, W.
Karatsu, K.
Kouwenhoven, K.
Lamers, D.
van der Linden, A. J.
Rostem, K.
Veen, M.
Wollack, E. J.
Baselmans, J. J. A.
Vollebregt, S.
Instrumentation and Methods for Astrophysics
Materials Science
Low-loss deposited dielectrics are beneficial for the advancement of superconducting integrated circuits for astronomy. In the microwave band ($\mathrm{\sim}$1$\unicode{x2013}$10 GHz) the cryogenic and low-power dielectric loss is dominated by two-level systems. However, the origin of the loss in the millimeter-submillimeter band ($\mathrm{\sim}$0.1$\unicode{x2013}$1 THz) is not understood. We measured the loss of hydrogenated amorphous SiC (a-SiC:H) films in the 0.27$\unicode{x2013}$100 THz range using superconducting microstrip resonators and Fourier-transform spectroscopy. The agreement between the loss data and a Maxwell-Helmholtz-Drude dispersion model suggests that vibrational modes above 10 THz dominate the loss in the a-SiC:H above 200 GHz.
title Vibrational modes as the origin of dielectric loss at 0.27$\unicode{x2013}$100 THz in a-SiC:H
topic Instrumentation and Methods for Astrophysics
Materials Science
url https://arxiv.org/abs/2405.13688