Leveraging Machine Learning for Advanced Nanoscale X-ray Analysis: Unmixing Multicomponent Signals and Enhancing Chemical Quantification

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Chen, Hui, Alexander, Duncan T. L., Hébert, Cécile
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866913359844081664
author Chen, Hui
Alexander, Duncan T. L.
Hébert, Cécile
author_facet Chen, Hui
Alexander, Duncan T. L.
Hébert, Cécile
contents Energy dispersive X-ray (EDX) spectroscopy in the transmission electron microscope is a key tool for nanomaterials analysis, providing a direct link between spatial and chemical information. However, using it for precisely determining chemical compositions presents challenges of noisy data from low X-ray yields and mixed signals from phases that overlap along the electron beam trajectory. Here, we introduce a novel method, non-negative matrix factorisation based pan-sharpening (PSNMF), to address these limitations. Leveraging the Poisson nature of EDX spectral noise and binning operations, PSNMF retrieves high quality phase spectral and spatial signatures via consecutive factorisations. After validating PSNMF with synthetic datasets of different noise levels, we illustrate its effectiveness on two distinct experimental cases: a nano-mineralogical lamella, and supported catalytic nanoparticles. Not only does PSNMF obtain accurate phase signatures, datasets reconstructed from the outputs have demonstrably lower noise and better fidelity than from the benchmark denoising method of principle component analysis.
format Preprint
id arxiv_https___arxiv_org_abs_2405_14649
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Leveraging Machine Learning for Advanced Nanoscale X-ray Analysis: Unmixing Multicomponent Signals and Enhancing Chemical Quantification
Chen, Hui
Alexander, Duncan T. L.
Hébert, Cécile
Materials Science
Mesoscale and Nanoscale Physics
Data Analysis, Statistics and Probability
Instrumentation and Detectors
Energy dispersive X-ray (EDX) spectroscopy in the transmission electron microscope is a key tool for nanomaterials analysis, providing a direct link between spatial and chemical information. However, using it for precisely determining chemical compositions presents challenges of noisy data from low X-ray yields and mixed signals from phases that overlap along the electron beam trajectory. Here, we introduce a novel method, non-negative matrix factorisation based pan-sharpening (PSNMF), to address these limitations. Leveraging the Poisson nature of EDX spectral noise and binning operations, PSNMF retrieves high quality phase spectral and spatial signatures via consecutive factorisations. After validating PSNMF with synthetic datasets of different noise levels, we illustrate its effectiveness on two distinct experimental cases: a nano-mineralogical lamella, and supported catalytic nanoparticles. Not only does PSNMF obtain accurate phase signatures, datasets reconstructed from the outputs have demonstrably lower noise and better fidelity than from the benchmark denoising method of principle component analysis.
title Leveraging Machine Learning for Advanced Nanoscale X-ray Analysis: Unmixing Multicomponent Signals and Enhancing Chemical Quantification
topic Materials Science
Mesoscale and Nanoscale Physics
Data Analysis, Statistics and Probability
Instrumentation and Detectors
url https://arxiv.org/abs/2405.14649