StyleX: A Trainable Metric for X-ray Style Distances
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arXiv
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| Autores principales: | , , , , , |
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| Formato: | Preprint |
| Publicado: |
2024
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| _version_ | 1866911885077512192 |
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| author | Eckert, Dominik Syben, Christopher Hümmer, Christian Ritschl, Ludwig Kappler, Steffen Stober, Sebastian |
| author_facet | Eckert, Dominik Syben, Christopher Hümmer, Christian Ritschl, Ludwig Kappler, Steffen Stober, Sebastian |
| contents | The progression of X-ray technology introduces diverse image styles that need to be adapted to the preferences of radiologists. To support this task, we introduce a novel deep learning-based metric that quantifies style differences of non-matching image pairs. At the heart of our metric is an encoder capable of generating X-ray image style representations. This encoder is trained without any explicit knowledge of style distances by exploiting Simple Siamese learning. During inference, the style representations produced by the encoder are used to calculate a distance metric for non-matching image pairs. Our experiments investigate the proposed concept for a disclosed reproducible and a proprietary image processing pipeline along two dimensions: First, we use a t-distributed stochastic neighbor embedding (t-SNE) analysis to illustrate that the encoder outputs provide meaningful and discriminative style representations. Second, the proposed metric calculated from the encoder outputs is shown to quantify style distances for non-matching pairs in good alignment with the human perception. These results confirm that our proposed method is a promising technique to quantify style differences, which can be used for guided style selection as well as automatic optimization of image pipeline parameters. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2405_14718 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | StyleX: A Trainable Metric for X-ray Style Distances Eckert, Dominik Syben, Christopher Hümmer, Christian Ritschl, Ludwig Kappler, Steffen Stober, Sebastian Computer Vision and Pattern Recognition Artificial Intelligence The progression of X-ray technology introduces diverse image styles that need to be adapted to the preferences of radiologists. To support this task, we introduce a novel deep learning-based metric that quantifies style differences of non-matching image pairs. At the heart of our metric is an encoder capable of generating X-ray image style representations. This encoder is trained without any explicit knowledge of style distances by exploiting Simple Siamese learning. During inference, the style representations produced by the encoder are used to calculate a distance metric for non-matching image pairs. Our experiments investigate the proposed concept for a disclosed reproducible and a proprietary image processing pipeline along two dimensions: First, we use a t-distributed stochastic neighbor embedding (t-SNE) analysis to illustrate that the encoder outputs provide meaningful and discriminative style representations. Second, the proposed metric calculated from the encoder outputs is shown to quantify style distances for non-matching pairs in good alignment with the human perception. These results confirm that our proposed method is a promising technique to quantify style differences, which can be used for guided style selection as well as automatic optimization of image pipeline parameters. |
| title | StyleX: A Trainable Metric for X-ray Style Distances |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence |
| url | https://arxiv.org/abs/2405.14718 |