Imaging topological polar structures in marginally twisted 2D semiconductors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Vu, Thi-Hai-Yen, Bennett, Daniel, Pallewella, Gayani Nadeera, Maniatis, Johnathon, Edwards, Josh, Uddin, Md Hemayet, Xing, Kaijian, Resendiz-Vazquez, Pablo, Lee, Seng Huat, Mao, Zhiqiang, Muir, Jack B., Jia, Linnan, Davis, Jeffrey A., Watanabe, Kenji, Taniguchi, Takashi, Adam, Shaffique, Sharma, Pankaj, Fuhrer, Michael S., Edmonds, Mark T.
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2405.15126