Analytical photoresponses of Schottky contact MoS2 phototransistors

Fuente: arXiv
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Main Authors: Wei, Jianyong, Liu, Yumeng, Wang, Yizhuo, Li, Kai, Lian, Zhentao, Xie, Maosong, Yang, Xinhan, Khaleghi, Seyed Saleh Mousavi, Dai, Fuxing, Hu, Weida, Gao, Xuejiao, Yang, Rui, Dan, Yaping
Format: Preprint
Published: 2024
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author Wei, Jianyong
Liu, Yumeng
Wang, Yizhuo
Li, Kai
Lian, Zhentao
Xie, Maosong
Yang, Xinhan
Khaleghi, Seyed Saleh Mousavi
Dai, Fuxing
Hu, Weida
Gao, Xuejiao
Yang, Rui
Dan, Yaping
author_facet Wei, Jianyong
Liu, Yumeng
Wang, Yizhuo
Li, Kai
Lian, Zhentao
Xie, Maosong
Yang, Xinhan
Khaleghi, Seyed Saleh Mousavi
Dai, Fuxing
Hu, Weida
Gao, Xuejiao
Yang, Rui
Dan, Yaping
contents High-gain photodetectors based on two-dimensional (2D) semiconductors, in particular those in photoconductive mode, have been extensively investigated in the past decade. However, the classical photoconductive theory was derived on two misplaced assumptions. In this work, we established an explicit analytical device model for Schottky contact MoS2 phototransistors that fits well with experimental data. From the fitting results, we found that the Richardson constant of the MoS2 Schottky contact is temperature dependent, indicating that the Schottky contacts for the 2D material is best described by the mixed thermionic emission and diffusion model. Based on this device model, we further established an analytical photoresponse for the few-layer MoS2 phototransistors, from which we found the voltage distribution on the two Schottky contacts and the channel, and extracted the minority carrier recombination lifetimes. The lifetimes are comparable with the values found from transient photoluminescence measurements, which therefore validates our analytical photoresponses for Schottky contact 2D semiconducting phototransistors.
format Preprint
id arxiv_https___arxiv_org_abs_2405_16209
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Analytical photoresponses of Schottky contact MoS2 phototransistors
Wei, Jianyong
Liu, Yumeng
Wang, Yizhuo
Li, Kai
Lian, Zhentao
Xie, Maosong
Yang, Xinhan
Khaleghi, Seyed Saleh Mousavi
Dai, Fuxing
Hu, Weida
Gao, Xuejiao
Yang, Rui
Dan, Yaping
Mesoscale and Nanoscale Physics
Materials Science
High-gain photodetectors based on two-dimensional (2D) semiconductors, in particular those in photoconductive mode, have been extensively investigated in the past decade. However, the classical photoconductive theory was derived on two misplaced assumptions. In this work, we established an explicit analytical device model for Schottky contact MoS2 phototransistors that fits well with experimental data. From the fitting results, we found that the Richardson constant of the MoS2 Schottky contact is temperature dependent, indicating that the Schottky contacts for the 2D material is best described by the mixed thermionic emission and diffusion model. Based on this device model, we further established an analytical photoresponse for the few-layer MoS2 phototransistors, from which we found the voltage distribution on the two Schottky contacts and the channel, and extracted the minority carrier recombination lifetimes. The lifetimes are comparable with the values found from transient photoluminescence measurements, which therefore validates our analytical photoresponses for Schottky contact 2D semiconducting phototransistors.
title Analytical photoresponses of Schottky contact MoS2 phototransistors
topic Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2405.16209