Extended spin relaxation times of optically addressed telecom defects in silicon carbide

Fuente: arXiv
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Bibliographic Details
Main Authors: Ahn, Jonghoon, Wicker, Christina, Bitner, Nolan, Solomon, Michael T., Tissot, Benedikt, Burkard, Guido, Dibos, Alan M., Zhang, Jiefei, Heremans, F. Joseph, Awschalom, David D.
Format: Preprint
Published: 2024
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