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Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kiene, Gerd, Ilik, Sadik, Mastrodomenico, Luigi, Babaie, Masoud, Sebastiano, Fabio
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Systems and Control
Online Access:	Acceder al recurso
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