Few-Shot Testing: Estimating Uncertainty of Memristive Deep Neural Networks Using One Bayesian Test Vector

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ahmed, Soyed Tuhin, Tahoori, Mehdi
Format:	Preprint
Published:	2024
Subjects:	Machine Learning Artificial Intelligence Emerging Technologies
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2405.18894