Development of the X-ray polarimeter using CMOS imager: polarization sensitivity of a $1.5~{\rm μm}$ pixel CMOS sensor
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| Autores principales: | , , , , , , , , , , , , |
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| Formato: | Preprint |
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2024
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| _version_ | 1866913685543321600 |
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| author | Iwata, Toshiya Hagino, Kouichi Odaka, Hirokazu Tamba, Tsubasa Ichihashi, Masahiro Kato, Tatsuaki Ishiwata, Kota Kuramoto, Haruki Matsuhashi, Hiroumi Arai, Shota Minami, Takahiro Takashima, Satoshi Bamba, Aya |
| author_facet | Iwata, Toshiya Hagino, Kouichi Odaka, Hirokazu Tamba, Tsubasa Ichihashi, Masahiro Kato, Tatsuaki Ishiwata, Kota Kuramoto, Haruki Matsuhashi, Hiroumi Arai, Shota Minami, Takahiro Takashima, Satoshi Bamba, Aya |
| contents | We are developing an imaging polarimeter by combining a fine-pixel CMOS image sensor with a coded aperture mask as part of the cipher project, aiming to achieve X-ray polarimetry in the energy range of $10$$\unicode{x2013}$$30~\mathrm{keV}$. A successful proof-of-concept experiment was conducted using a fine-pixel CMOS sensor with a $2.5~\mathrm{μm}$ pixel size. In this study, we conducted beam experiments to assess the modulation factor (MF) of the CMOS sensor with a $1.5~\mathrm{μm}$ pixel size manufactured by Canon and to determine if there was any improvement in the MF. The measured MF was $8.32\% \pm 0.34\%$ at $10~\mathrm{keV}$ and $16.10\% \pm 0.68\%$ at $22~\mathrm{keV}$, exceeding those of the $2.5~\mathrm{μm}$ sensor in the $6$$\unicode{x2013}$$22~\mathrm{keV}$ range. We also evaluated the quantum efficiency of the sensor, inferring a detection layer thickness of $2.67 \pm 0.48~{\rm μm}$. To develop a more sensitive polarimeter, a sensor with a thicker detection layer, smaller pixel size, and reduced thermal diffusion effect is desirable. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2405_18907 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Development of the X-ray polarimeter using CMOS imager: polarization sensitivity of a $1.5~{\rm μm}$ pixel CMOS sensor Iwata, Toshiya Hagino, Kouichi Odaka, Hirokazu Tamba, Tsubasa Ichihashi, Masahiro Kato, Tatsuaki Ishiwata, Kota Kuramoto, Haruki Matsuhashi, Hiroumi Arai, Shota Minami, Takahiro Takashima, Satoshi Bamba, Aya Instrumentation and Methods for Astrophysics We are developing an imaging polarimeter by combining a fine-pixel CMOS image sensor with a coded aperture mask as part of the cipher project, aiming to achieve X-ray polarimetry in the energy range of $10$$\unicode{x2013}$$30~\mathrm{keV}$. A successful proof-of-concept experiment was conducted using a fine-pixel CMOS sensor with a $2.5~\mathrm{μm}$ pixel size. In this study, we conducted beam experiments to assess the modulation factor (MF) of the CMOS sensor with a $1.5~\mathrm{μm}$ pixel size manufactured by Canon and to determine if there was any improvement in the MF. The measured MF was $8.32\% \pm 0.34\%$ at $10~\mathrm{keV}$ and $16.10\% \pm 0.68\%$ at $22~\mathrm{keV}$, exceeding those of the $2.5~\mathrm{μm}$ sensor in the $6$$\unicode{x2013}$$22~\mathrm{keV}$ range. We also evaluated the quantum efficiency of the sensor, inferring a detection layer thickness of $2.67 \pm 0.48~{\rm μm}$. To develop a more sensitive polarimeter, a sensor with a thicker detection layer, smaller pixel size, and reduced thermal diffusion effect is desirable. |
| title | Development of the X-ray polarimeter using CMOS imager: polarization sensitivity of a $1.5~{\rm μm}$ pixel CMOS sensor |
| topic | Instrumentation and Methods for Astrophysics |
| url | https://arxiv.org/abs/2405.18907 |