Barrier height inhomogeneity and origin of 1/f-noise in topological insulator-based photo-detector

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Main Authors: Kalimuddin, Sk, Das, Biswajit, Chatterjee, Sudipta, Bera, Arnab, Bera, Satyabrata, Chattopadhyay, Kalyan Kumar, Mondal, Mintu
Format: Preprint
Published: 2024
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author Kalimuddin, Sk
Das, Biswajit
Chatterjee, Sudipta
Bera, Arnab
Bera, Satyabrata
Chattopadhyay, Kalyan Kumar
Mondal, Mintu
author_facet Kalimuddin, Sk
Das, Biswajit
Chatterjee, Sudipta
Bera, Arnab
Bera, Satyabrata
Chattopadhyay, Kalyan Kumar
Mondal, Mintu
contents Topological insulators (TIs) with symmetry-protected surface states, offer exciting opportunities for next-generation photonic and optoelectronic device applications. The heterojunctions of TIs and semiconductors (e.g. Si, Ge) have been observed to excellent photo-responsive characteristics. However, the realization of high-frequency operations in these heterojunctions can be hindered by unwanted 1/f (or Flicker) noise and phase noise. Therefore, an in-depth understanding of 1/f noise figures becomes paramount for the effective utilization of such materials.Here we report optoelectronic response and 1/f noise characteristics of a p-n diode fabricated using topological insulator, Bi2Se3 and silicon for potential photo-detector. Through meticulous temperature-dependent current-voltage (I-V) and capacitance-voltage (C-V) measurements, we ascertain crucial parameters like barrier height, ideality factor, and reverse saturation current of the photodetector. The low-frequency 1/f conductance noise spectra suggest a significant presence of trap states influencing the optoelectronic transport properties. The forward noise characteristics exhibit typical 1/f features, having a uni-slope across four decades of frequency, suggesting a homogeneous distribution of barrier height. The spectral and photocurrent-dependent responses show the power law behavior of noise level on photon flux. The hybrid heterojunction demonstrates excellent photo-response and reasonably low noise level, promising signatures for the room-temperature visible photodetector applications.
format Preprint
id arxiv_https___arxiv_org_abs_2405_19110
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Barrier height inhomogeneity and origin of 1/f-noise in topological insulator-based photo-detector
Kalimuddin, Sk
Das, Biswajit
Chatterjee, Sudipta
Bera, Arnab
Bera, Satyabrata
Chattopadhyay, Kalyan Kumar
Mondal, Mintu
Strongly Correlated Electrons
Mesoscale and Nanoscale Physics
Materials Science
Topological insulators (TIs) with symmetry-protected surface states, offer exciting opportunities for next-generation photonic and optoelectronic device applications. The heterojunctions of TIs and semiconductors (e.g. Si, Ge) have been observed to excellent photo-responsive characteristics. However, the realization of high-frequency operations in these heterojunctions can be hindered by unwanted 1/f (or Flicker) noise and phase noise. Therefore, an in-depth understanding of 1/f noise figures becomes paramount for the effective utilization of such materials.Here we report optoelectronic response and 1/f noise characteristics of a p-n diode fabricated using topological insulator, Bi2Se3 and silicon for potential photo-detector. Through meticulous temperature-dependent current-voltage (I-V) and capacitance-voltage (C-V) measurements, we ascertain crucial parameters like barrier height, ideality factor, and reverse saturation current of the photodetector. The low-frequency 1/f conductance noise spectra suggest a significant presence of trap states influencing the optoelectronic transport properties. The forward noise characteristics exhibit typical 1/f features, having a uni-slope across four decades of frequency, suggesting a homogeneous distribution of barrier height. The spectral and photocurrent-dependent responses show the power law behavior of noise level on photon flux. The hybrid heterojunction demonstrates excellent photo-response and reasonably low noise level, promising signatures for the room-temperature visible photodetector applications.
title Barrier height inhomogeneity and origin of 1/f-noise in topological insulator-based photo-detector
topic Strongly Correlated Electrons
Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2405.19110