Multi-line study of the radial extent of SiO, CS, and SiS in AGB envelopes

Fuente: arXiv
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Bibliographic Details
Main Authors: Massalkhi, S., Agundez, M., Fonfria, J. P., Pardo, J. R., Velilla-Prieto, L., Cernicharo, J.
Format: Preprint
Published: 2024
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