Simultaneous Measurement of Thermal Conductivity and Heat Capacity Across Diverse Materials Using the Square-Pulsed Source (SPS) Technique
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| Main Authors: | , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866909585231577088 |
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| author | Chen, Tao Song, Shangzhi Shen, Yang Zhang, Kexin Jiang, Puqing |
| author_facet | Chen, Tao Song, Shangzhi Shen, Yang Zhang, Kexin Jiang, Puqing |
| contents | State-of-the-art techniques like dual-frequency Time-Domain Thermoreflectance (TDTR) and Frequency-Domain Thermoreflectance (FDTR) offer superb capability for simultaneous measurements of thermal conductivity and heat capacity with a spatial resolution on the order of 10 μm. However, their applicability is limited to highly conductive materials with an in-plane thermal conductivity exceeding 10 W/(m*K). In this paper, we introduce the Square-Pulsed Source (SPS) technique, offering a novel approach to concurrently measure thermal conductivity and heat capacity with a 10 μm spatial resolution, while significantly extending the measurable thermal conductivity range to an unprecedented low of 0.1 W/(m*K), offering enhanced versatility. To demonstrate and validate its efficacy, we conducted measurements on various standard materials--PMMA, silica, sapphire, silicon, and diamond--spanning a wide thermal conductivity range from 0.1 to 2000 W/(m*K). The obtained results exhibit remarkable agreement with literature values, with a typical measurement uncertainty of less than 10% across the entire thermal conductivity range. By providing a unique capability to characterize both highly and lowly conductive materials with micron-scale spatial resolution, the SPS method opens new avenues for understanding and engineering thermal properties across diverse applications. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2405_20870 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Simultaneous Measurement of Thermal Conductivity and Heat Capacity Across Diverse Materials Using the Square-Pulsed Source (SPS) Technique Chen, Tao Song, Shangzhi Shen, Yang Zhang, Kexin Jiang, Puqing Applied Physics State-of-the-art techniques like dual-frequency Time-Domain Thermoreflectance (TDTR) and Frequency-Domain Thermoreflectance (FDTR) offer superb capability for simultaneous measurements of thermal conductivity and heat capacity with a spatial resolution on the order of 10 μm. However, their applicability is limited to highly conductive materials with an in-plane thermal conductivity exceeding 10 W/(m*K). In this paper, we introduce the Square-Pulsed Source (SPS) technique, offering a novel approach to concurrently measure thermal conductivity and heat capacity with a 10 μm spatial resolution, while significantly extending the measurable thermal conductivity range to an unprecedented low of 0.1 W/(m*K), offering enhanced versatility. To demonstrate and validate its efficacy, we conducted measurements on various standard materials--PMMA, silica, sapphire, silicon, and diamond--spanning a wide thermal conductivity range from 0.1 to 2000 W/(m*K). The obtained results exhibit remarkable agreement with literature values, with a typical measurement uncertainty of less than 10% across the entire thermal conductivity range. By providing a unique capability to characterize both highly and lowly conductive materials with micron-scale spatial resolution, the SPS method opens new avenues for understanding and engineering thermal properties across diverse applications. |
| title | Simultaneous Measurement of Thermal Conductivity and Heat Capacity Across Diverse Materials Using the Square-Pulsed Source (SPS) Technique |
| topic | Applied Physics |
| url | https://arxiv.org/abs/2405.20870 |