Fast characterization of multiplexed single-electron pumps with machine learning

Fuente: arXiv
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Main Authors: Schoinas, N., Rath, Y., Norimoto, S., Xie, W., See, P., Griffiths, J. P., Chen, C., Ritchie, D. A., Kataoka, M., Rossi, A., Rungger, I.
Format: Preprint
Published: 2024
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author Schoinas, N.
Rath, Y.
Norimoto, S.
Xie, W.
See, P.
Griffiths, J. P.
Chen, C.
Ritchie, D. A.
Kataoka, M.
Rossi, A.
Rungger, I.
author_facet Schoinas, N.
Rath, Y.
Norimoto, S.
Xie, W.
See, P.
Griffiths, J. P.
Chen, C.
Ritchie, D. A.
Kataoka, M.
Rossi, A.
Rungger, I.
contents We present an efficient machine learning based automated framework for the fast tuning of single-electron pump devices into current quantization regimes. It uses a sparse measurement approach based on an iterative active learning algorithm to take targeted measurements in the gate voltage parameter space. When compared to conventional parameter scans, our automated framework allows us to decrease the number of measurement points by about an order of magnitude. This corresponds to an eight-fold decrease in the time required to determine quantization errors, which are estimated via an exponential extrapolation of the first current plateau embedded into the algorithm. We show the robustness of the framework by characterizing 28 individual devices arranged in a GaAs/AlGaAs multiplexer array, which we use to identify a subset of devices suitable for parallel operation at communal gate voltages. The method opens up the possibility to efficiently scale the characterization of such multiplexed devices to a large number of pumps.
format Preprint
id arxiv_https___arxiv_org_abs_2405_20946
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Fast characterization of multiplexed single-electron pumps with machine learning
Schoinas, N.
Rath, Y.
Norimoto, S.
Xie, W.
See, P.
Griffiths, J. P.
Chen, C.
Ritchie, D. A.
Kataoka, M.
Rossi, A.
Rungger, I.
Mesoscale and Nanoscale Physics
Quantum Physics
We present an efficient machine learning based automated framework for the fast tuning of single-electron pump devices into current quantization regimes. It uses a sparse measurement approach based on an iterative active learning algorithm to take targeted measurements in the gate voltage parameter space. When compared to conventional parameter scans, our automated framework allows us to decrease the number of measurement points by about an order of magnitude. This corresponds to an eight-fold decrease in the time required to determine quantization errors, which are estimated via an exponential extrapolation of the first current plateau embedded into the algorithm. We show the robustness of the framework by characterizing 28 individual devices arranged in a GaAs/AlGaAs multiplexer array, which we use to identify a subset of devices suitable for parallel operation at communal gate voltages. The method opens up the possibility to efficiently scale the characterization of such multiplexed devices to a large number of pumps.
title Fast characterization of multiplexed single-electron pumps with machine learning
topic Mesoscale and Nanoscale Physics
Quantum Physics
url https://arxiv.org/abs/2405.20946