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Bibliographic Details
Main Authors: Warren, Houston, Oliveira, Rafael, Ramos, Fabio
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2406.00438
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author Warren, Houston
Oliveira, Rafael
Ramos, Fabio
author_facet Warren, Houston
Oliveira, Rafael
Ramos, Fabio
contents In large-scale regression problems, random Fourier features (RFFs) have significantly enhanced the computational scalability and flexibility of Gaussian processes (GPs) by defining kernels through their spectral density, from which a finite set of Monte Carlo samples can be used to form an approximate low-rank GP. However, the efficacy of RFFs in kernel approximation and Bayesian kernel learning depends on the ability to tractably sample the kernel spectral measure and the quality of the generated samples. We introduce Stein random features (SRF), leveraging Stein variational gradient descent, which can be used to both generate high-quality RFF samples of known spectral densities as well as flexibly and efficiently approximate traditionally non-analytical spectral measure posteriors. SRFs require only the evaluation of log-probability gradients to perform both kernel approximation and Bayesian kernel learning that results in superior performance over traditional approaches. We empirically validate the effectiveness of SRFs by comparing them to baselines on kernel approximation and well-known GP regression problems.
format Preprint
id arxiv_https___arxiv_org_abs_2406_00438
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Stein Random Feature Regression
Warren, Houston
Oliveira, Rafael
Ramos, Fabio
Machine Learning
In large-scale regression problems, random Fourier features (RFFs) have significantly enhanced the computational scalability and flexibility of Gaussian processes (GPs) by defining kernels through their spectral density, from which a finite set of Monte Carlo samples can be used to form an approximate low-rank GP. However, the efficacy of RFFs in kernel approximation and Bayesian kernel learning depends on the ability to tractably sample the kernel spectral measure and the quality of the generated samples. We introduce Stein random features (SRF), leveraging Stein variational gradient descent, which can be used to both generate high-quality RFF samples of known spectral densities as well as flexibly and efficiently approximate traditionally non-analytical spectral measure posteriors. SRFs require only the evaluation of log-probability gradients to perform both kernel approximation and Bayesian kernel learning that results in superior performance over traditional approaches. We empirically validate the effectiveness of SRFs by comparing them to baselines on kernel approximation and well-known GP regression problems.
title Stein Random Feature Regression
topic Machine Learning
url https://arxiv.org/abs/2406.00438