Deep Learning based Performance Testing for Analog Integrated Circuits

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cao, Jiawei, Guo, Chongtao, Li, Hao, Wang, Zhigang, Wang, Houjun, Li, Geoffrey Ye
Format:	Preprint
Published:	2024
Subjects:	Systems and Control
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.00516