Real-space tilting method for atomic resolution STEM imaging of nanocrystalline materials

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wei, Jiake, Xu, Zhangze, Shen, Wenjie, Feng, Bin, Ishikawa, Ryo, Shibata, Naoya, Ikuhara, Yuichi, Bai, Xuedong
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.00948