Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
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arXiv
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| Main Authors: | , , , , , , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866917683200524288 |
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| author | Schloz, Marcel Pekin, Thomas C. Brown, Hamish G. Byrne, Dana O. Esser, Bryan D. Terzoudis-Lumsden, Emmanuel Taniguchi, Takashi Watanabe, Kenji Findlay, Scott D. Haas, Benedikt Ciston, Jim Koch, Christoph T. |
| author_facet | Schloz, Marcel Pekin, Thomas C. Brown, Hamish G. Byrne, Dana O. Esser, Bryan D. Terzoudis-Lumsden, Emmanuel Taniguchi, Takashi Watanabe, Kenji Findlay, Scott D. Haas, Benedikt Ciston, Jim Koch, Christoph T. |
| contents | A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychography, regularized ptychography, and multi-mode ptychography. Additionally, we contrast multi-focus ptychography with an alternative method that uses virtual optical sectioning through a reconstructed scattering matrix ($\mathcal{S}$-matrix), which offers more precise 3D structure information compared to conventional ptychography. Our findings from multiple 3D reconstructions based on simulated and experimental data demonstrate that multi-focus ptychography surpasses other techniques, particularly in accurately reconstructing the surfaces and interface regions of thick specimens. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2406_01141 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements Schloz, Marcel Pekin, Thomas C. Brown, Hamish G. Byrne, Dana O. Esser, Bryan D. Terzoudis-Lumsden, Emmanuel Taniguchi, Takashi Watanabe, Kenji Findlay, Scott D. Haas, Benedikt Ciston, Jim Koch, Christoph T. Optics Materials Science Computational Physics A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychography, regularized ptychography, and multi-mode ptychography. Additionally, we contrast multi-focus ptychography with an alternative method that uses virtual optical sectioning through a reconstructed scattering matrix ($\mathcal{S}$-matrix), which offers more precise 3D structure information compared to conventional ptychography. Our findings from multiple 3D reconstructions based on simulated and experimental data demonstrate that multi-focus ptychography surpasses other techniques, particularly in accurately reconstructing the surfaces and interface regions of thick specimens. |
| title | Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements |
| topic | Optics Materials Science Computational Physics |
| url | https://arxiv.org/abs/2406.01141 |