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Main Authors: Zhang, Zhihan, Chen, Senrui, Liu, Yunchao, Jiang, Liang
Format: Preprint
Published: 2024
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Online Access:https://arxiv.org/abs/2406.02669
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author Zhang, Zhihan
Chen, Senrui
Liu, Yunchao
Jiang, Liang
author_facet Zhang, Zhihan
Chen, Senrui
Liu, Yunchao
Jiang, Liang
contents Mid-circuit measurements (MCMs) are crucial ingredients in the development of fault-tolerant quantum computation. While there have been rapid experimental progresses in realizing MCMs, a systematic method for characterizing noisy MCMs is still under exploration. In this work we develop a cycle benchmarking (CB)-type algorithm to characterize noisy MCMs. The key idea is to use a joint Fourier transform on the classical and quantum registers and then estimate parameters in the Fourier space, analogous to Pauli fidelities used in CB-type algorithms for characterizing the Pauli noise channel of Clifford gates. Furthermore, we develop a theory of the noise learnability of MCMs, which determines what information can be learned about the noise model (in the presence of state preparation and terminating measurement (SPAM) noise) and what cannot, which shows that all learnable information can be learned using our algorithm. As an application, we show how to use the learned information to test the independence between measurement noise and state preparation noise in an MCM. Finally, we conduct numerical simulations to illustrate the practical applicability of the algorithm. Similar to other CB-type algorithms, we expect the algorithm to provide a useful toolkit that is of experimental interest.
format Preprint
id arxiv_https___arxiv_org_abs_2406_02669
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A generalized cycle benchmarking algorithm for characterizing mid-circuit measurements
Zhang, Zhihan
Chen, Senrui
Liu, Yunchao
Jiang, Liang
Quantum Physics
Mid-circuit measurements (MCMs) are crucial ingredients in the development of fault-tolerant quantum computation. While there have been rapid experimental progresses in realizing MCMs, a systematic method for characterizing noisy MCMs is still under exploration. In this work we develop a cycle benchmarking (CB)-type algorithm to characterize noisy MCMs. The key idea is to use a joint Fourier transform on the classical and quantum registers and then estimate parameters in the Fourier space, analogous to Pauli fidelities used in CB-type algorithms for characterizing the Pauli noise channel of Clifford gates. Furthermore, we develop a theory of the noise learnability of MCMs, which determines what information can be learned about the noise model (in the presence of state preparation and terminating measurement (SPAM) noise) and what cannot, which shows that all learnable information can be learned using our algorithm. As an application, we show how to use the learned information to test the independence between measurement noise and state preparation noise in an MCM. Finally, we conduct numerical simulations to illustrate the practical applicability of the algorithm. Similar to other CB-type algorithms, we expect the algorithm to provide a useful toolkit that is of experimental interest.
title A generalized cycle benchmarking algorithm for characterizing mid-circuit measurements
topic Quantum Physics
url https://arxiv.org/abs/2406.02669