Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Fuente: arXiv
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Bibliographic Details
Main Authors: Dong, Zehao, Zhang, Yang, Chiu, Chun-Chien, Lu, Sicheng, Zhang, Jianbing, Liu, Yu-Chen, Liu, Suya, Yang, Jan-Chi, Yu, Pu, Wang, Yayu, Chen, Zhen
Format: Preprint
Published: 2024
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