Cita APA (7a ed.)

Ma, R., Yang, Y., Liu, Z., Zhang, J., Li, M., Huang, J., & Luo, G. (2024). VerilogReader: LLM-Aided Hardware Test Generation.

Cita Chicago Style (17a ed.)

Ma, Ruiyang, Yuxin Yang, Ziqian Liu, Jiaxi Zhang, Min Li, Junhua Huang, y Guojie Luo. VerilogReader: LLM-Aided Hardware Test Generation. 2024.

Cita MLA (9a ed.)

Ma, Ruiyang, et al. VerilogReader: LLM-Aided Hardware Test Generation. 2024.