Considerations for extracting moiré-level strain from dark field intensities in transmission electron microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Craig, Isaac M., Van Winkle, Madeline, Ophus, Colin, Bediako, D. Kwabena
Format:	Preprint
Published:	2024
Subjects:	Materials Science Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.04515