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Considerations for extracting moiré-level strain from dark field intensities in transmission electron microscopy

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Craig, Isaac M., Van Winkle, Madeline, Ophus, Colin, Bediako, D. Kwabena
Format:	Preprint
Publié:	2024
Sujets:	Materials Science Optics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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