Jaworski, M., Mrowiński, P., Burakowski, M., Holewa, P., Zeidler, L., Syperek, M., . . . Sęk, G. (2024). Xenon plasma-focused ion beam milling as a method to deterministically fabricate bright and high-purity single-photon sources operating at C-band.
Citazione stile Chigago Style (17a edizione)Jaworski, Maciej, Paweł Mrowiński, Marek Burakowski, Paweł Holewa, Laura Zeidler, Marcin Syperek, Elizaveta Semenova, e Grzegorz Sęk. Xenon Plasma-focused Ion Beam Milling as a Method to Deterministically Fabricate Bright and High-purity Single-photon Sources Operating at C-band. 2024.
Citatione MLA (9a ed.)Jaworski, Maciej, et al. Xenon Plasma-focused Ion Beam Milling as a Method to Deterministically Fabricate Bright and High-purity Single-photon Sources Operating at C-band. 2024.
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