Lee, S., Yoon, J., & Choi, J. (2024). Design of reliable technology valuation model with calibrated machine learning of patent indicators.
Style de citation Chicago (17e éd.)Lee, Seunghyun, Janghyeok Yoon, et Jaewoong Choi. Design of Reliable Technology Valuation Model with Calibrated Machine Learning of Patent Indicators. 2024.
Style de citation MLA (9e éd.)Lee, Seunghyun, et al. Design of Reliable Technology Valuation Model with Calibrated Machine Learning of Patent Indicators. 2024.
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