Resilient Growth of Highly Crystalline Topological Insulator-Superconductor Heterostructure Enabled by Ex-situ Nitride Film

Fuente: arXiv
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Autori principali: Xie, Renjie, Ge, Min, Xiao, Shaozhu, Zhang, Jiahui, Bi, Jiachang, Yuan, Xiaoyu, Yi, Hee Taek, Wang, Baomin, Oh, Seongshik, Cao, Yanwei, Yao, Xiong
Natura: Preprint
Pubblicazione: 2024
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author Xie, Renjie
Ge, Min
Xiao, Shaozhu
Zhang, Jiahui
Bi, Jiachang
Yuan, Xiaoyu
Yi, Hee Taek
Wang, Baomin
Oh, Seongshik
Cao, Yanwei
Yao, Xiong
author_facet Xie, Renjie
Ge, Min
Xiao, Shaozhu
Zhang, Jiahui
Bi, Jiachang
Yuan, Xiaoyu
Yi, Hee Taek
Wang, Baomin
Oh, Seongshik
Cao, Yanwei
Yao, Xiong
contents Highly crystalline and easily feasible topological insulator-superconductor (TI-SC) heterostructures are crucial for the development of practical topological qubit devices. The optimal superconducting layer for TI-SC heterostructures should be highly resilient against external contaminations and structurally compatible with TIs. In this study, we provide a solution to this challenge by showcasing the growth of a highly crystalline TI-SC heterostructure using refractory TiN (111) as the superconducting layer. This approach can eliminate the need for in-situ cleaving or growth. More importantly, the TiN surface shows high resilience against contaminations during air exposure, as demonstrated by the successful recyclable growth of Bi2Se3. Our findings indicate that TI-SC heterostructures based on nitride films are compatible with device fabrication techniques, paving a path to the realization of practical topological qubit devices in the future.
format Preprint
id arxiv_https___arxiv_org_abs_2406_06112
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Resilient Growth of Highly Crystalline Topological Insulator-Superconductor Heterostructure Enabled by Ex-situ Nitride Film
Xie, Renjie
Ge, Min
Xiao, Shaozhu
Zhang, Jiahui
Bi, Jiachang
Yuan, Xiaoyu
Yi, Hee Taek
Wang, Baomin
Oh, Seongshik
Cao, Yanwei
Yao, Xiong
Mesoscale and Nanoscale Physics
Superconductivity
Highly crystalline and easily feasible topological insulator-superconductor (TI-SC) heterostructures are crucial for the development of practical topological qubit devices. The optimal superconducting layer for TI-SC heterostructures should be highly resilient against external contaminations and structurally compatible with TIs. In this study, we provide a solution to this challenge by showcasing the growth of a highly crystalline TI-SC heterostructure using refractory TiN (111) as the superconducting layer. This approach can eliminate the need for in-situ cleaving or growth. More importantly, the TiN surface shows high resilience against contaminations during air exposure, as demonstrated by the successful recyclable growth of Bi2Se3. Our findings indicate that TI-SC heterostructures based on nitride films are compatible with device fabrication techniques, paving a path to the realization of practical topological qubit devices in the future.
title Resilient Growth of Highly Crystalline Topological Insulator-Superconductor Heterostructure Enabled by Ex-situ Nitride Film
topic Mesoscale and Nanoscale Physics
Superconductivity
url https://arxiv.org/abs/2406.06112