PatentEval: Understanding Errors in Patent Generation

Fuente: arXiv
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Autori principali: Zuo, You, Gerdes, Kim, de La Clergerie, Eric Villemonte, Sagot, Benoît
Natura: Preprint
Pubblicazione: 2024
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author Zuo, You
Gerdes, Kim
de La Clergerie, Eric Villemonte
Sagot, Benoît
author_facet Zuo, You
Gerdes, Kim
de La Clergerie, Eric Villemonte
Sagot, Benoît
contents In this work, we introduce a comprehensive error typology specifically designed for evaluating two distinct tasks in machine-generated patent texts: claims-to-abstract generation, and the generation of the next claim given previous ones. We have also developed a benchmark, PatentEval, for systematically assessing language models in this context. Our study includes a comparative analysis, annotated by humans, of various models. These range from those specifically adapted during training for tasks within the patent domain to the latest general-purpose large language models (LLMs). Furthermore, we explored and evaluated some metrics to approximate human judgments in patent text evaluation, analyzing the extent to which these metrics align with expert assessments. These approaches provide valuable insights into the capabilities and limitations of current language models in the specialized field of patent text generation.
format Preprint
id arxiv_https___arxiv_org_abs_2406_06589
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle PatentEval: Understanding Errors in Patent Generation
Zuo, You
Gerdes, Kim
de La Clergerie, Eric Villemonte
Sagot, Benoît
Computation and Language
Artificial Intelligence
In this work, we introduce a comprehensive error typology specifically designed for evaluating two distinct tasks in machine-generated patent texts: claims-to-abstract generation, and the generation of the next claim given previous ones. We have also developed a benchmark, PatentEval, for systematically assessing language models in this context. Our study includes a comparative analysis, annotated by humans, of various models. These range from those specifically adapted during training for tasks within the patent domain to the latest general-purpose large language models (LLMs). Furthermore, we explored and evaluated some metrics to approximate human judgments in patent text evaluation, analyzing the extent to which these metrics align with expert assessments. These approaches provide valuable insights into the capabilities and limitations of current language models in the specialized field of patent text generation.
title PatentEval: Understanding Errors in Patent Generation
topic Computation and Language
Artificial Intelligence
url https://arxiv.org/abs/2406.06589