A PRISMA Driven Systematic Review of Publicly Available Datasets for Benchmark and Model Developments for Industrial Defect Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Akbas, Can, Arin, Irem Su, Onal, Sinan
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.07694