Bai, J., Wu, D., Shelley, T., Schubel, P., Twine, D., Russell, J., . . . Zhang, J. (2024). A Comprehensive Survey on Machine Learning Driven Material Defect Detection.
Chicago Style (17th ed.) CitationBai, Jun, Di Wu, Tristan Shelley, Peter Schubel, David Twine, John Russell, Xuesen Zeng, and Ji Zhang. A Comprehensive Survey on Machine Learning Driven Material Defect Detection. 2024.
MLA (9th ed.) CitationBai, Jun, et al. A Comprehensive Survey on Machine Learning Driven Material Defect Detection. 2024.
Warning: These citations may not always be 100% accurate.