Bai, J., Wu, D., Shelley, T., Schubel, P., Twine, D., Russell, J., . . . Zhang, J. (2024). A Comprehensive Survey on Machine Learning Driven Material Defect Detection.
Style de citation Chicago (17e éd.)Bai, Jun, Di Wu, Tristan Shelley, Peter Schubel, David Twine, John Russell, Xuesen Zeng, et Ji Zhang. A Comprehensive Survey on Machine Learning Driven Material Defect Detection. 2024.
Style de citation MLA (9e éd.)Bai, Jun, et al. A Comprehensive Survey on Machine Learning Driven Material Defect Detection. 2024.
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