Liu, Z., Zhong, X., Deng, X., Hong, S., Gao, X., & Sun, H. (2024). Scalable Defect Detection via Traversal on Code Graph.
Cita Chicago Style (17a ed.)Liu, Zhengyao, Xitong Zhong, Xingjing Deng, Shuo Hong, Xiang Gao, y Hailong Sun. Scalable Defect Detection via Traversal on Code Graph. 2024.
Cita MLA (9a ed.)Liu, Zhengyao, et al. Scalable Defect Detection via Traversal on Code Graph. 2024.
Precaución: Estas citas no son 100% exactas.