Scaling behavior of the localization length for TE waves at critical incidence on short-range correlated stratified random media

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kim, Seulong, Kim, Kihong
Format:	Preprint
Published:	2024
Subjects:	Optics Disordered Systems and Neural Networks
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.08156