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Bibliographic Details
Main Authors: Anishchik, Sergei V., Dantus, Marcos
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2406.08403
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author Anishchik, Sergei V.
Dantus, Marcos
author_facet Anishchik, Sergei V.
Dantus, Marcos
contents A microscope based on the Linnik interferometer was designed, built, and tested. Two methods were used for interference pattern measurement: phase-shifting and polarized single-shot methods. The former uses a low coherence light emitting diode as a light source, providing 10 nm resolution in the Z direction and diffraction-limited resolution in the X and Y directions. The second method is insensitive to vibrations and enables observation of moving objects. The simplicity and low cost of this instrument make it valuable for a variety of applications.
format Preprint
id arxiv_https___arxiv_org_abs_2406_08403
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Optical microscope with nanometer longitudinal resolution based on a Linnik interferometer
Anishchik, Sergei V.
Dantus, Marcos
Optics
A microscope based on the Linnik interferometer was designed, built, and tested. Two methods were used for interference pattern measurement: phase-shifting and polarized single-shot methods. The former uses a low coherence light emitting diode as a light source, providing 10 nm resolution in the Z direction and diffraction-limited resolution in the X and Y directions. The second method is insensitive to vibrations and enables observation of moving objects. The simplicity and low cost of this instrument make it valuable for a variety of applications.
title Optical microscope with nanometer longitudinal resolution based on a Linnik interferometer
topic Optics
url https://arxiv.org/abs/2406.08403