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| Auteurs principaux: | , , , , , , , , , , , |
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| Format: | Preprint |
| Publié: |
2024
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| Sujets: | |
| Accès en ligne: | https://arxiv.org/abs/2406.08681 |
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| _version_ | 1866909223078592512 |
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| author | Tran, Steven J. Uslu, Jan-Lucas Pendharkar, Mihir Finney, Joe Sharpe, Aaron L. Hocking, Marisa Bittner, Nathan J. Watanabe, Kenji Taniguchi, Takashi Kastner, Marc A. Mannix, Andrew J. Goldhaber-Gordon, David |
| author_facet | Tran, Steven J. Uslu, Jan-Lucas Pendharkar, Mihir Finney, Joe Sharpe, Aaron L. Hocking, Marisa Bittner, Nathan J. Watanabe, Kenji Taniguchi, Takashi Kastner, Marc A. Mannix, Andrew J. Goldhaber-Gordon, David |
| contents | Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these techniques enables extracting the moiré lattice vectors from a scanning probe image. We have found that the extracted values, while precise, are not necessarily accurate. Scan-to-scan variations in the behavior of the piezos which drive the scanning probe, and thermally-driven slow relative drift between probe and sample, produce systematic errors in the extraction of lattice vectors. In this Letter, we identify the errors and provide a protocol to correct for them. Applying this protocol to an ensemble of ten successive scans of near-magic-angle twisted bilayer graphene, we are able to reduce our errors in extracting lattice vectors to less than 1%. This translates to extracting twist angles with a statistical uncertainty less than 0.001° and uniaxial heterostrain with uncertainty on the order of 0.002%. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2406_08681 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Quantitative determination of twist angle and strain in Van der Waals moiré superlattices Tran, Steven J. Uslu, Jan-Lucas Pendharkar, Mihir Finney, Joe Sharpe, Aaron L. Hocking, Marisa Bittner, Nathan J. Watanabe, Kenji Taniguchi, Takashi Kastner, Marc A. Mannix, Andrew J. Goldhaber-Gordon, David Materials Science Mesoscale and Nanoscale Physics Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these techniques enables extracting the moiré lattice vectors from a scanning probe image. We have found that the extracted values, while precise, are not necessarily accurate. Scan-to-scan variations in the behavior of the piezos which drive the scanning probe, and thermally-driven slow relative drift between probe and sample, produce systematic errors in the extraction of lattice vectors. In this Letter, we identify the errors and provide a protocol to correct for them. Applying this protocol to an ensemble of ten successive scans of near-magic-angle twisted bilayer graphene, we are able to reduce our errors in extracting lattice vectors to less than 1%. This translates to extracting twist angles with a statistical uncertainty less than 0.001° and uniaxial heterostrain with uncertainty on the order of 0.002%. |
| title | Quantitative determination of twist angle and strain in Van der Waals moiré superlattices |
| topic | Materials Science Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2406.08681 |