Growth and characterization of the La$_{3}$Ni$_{2}$O$_{7-δ}$ thin films: dominant contribution of the $d_{x^{2}-y^{2}}$ orbital at ambient pressure

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Main Authors: Liu, Yuecong, Ou, Mengjun, Chu, Haifeng, Yang, Huan, Li, Qing, Zhang, Yingjie, Wen, Hai-Hu
Format: Preprint
Published: 2024
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author Liu, Yuecong
Ou, Mengjun
Chu, Haifeng
Yang, Huan
Li, Qing
Zhang, Yingjie
Wen, Hai-Hu
author_facet Liu, Yuecong
Ou, Mengjun
Chu, Haifeng
Yang, Huan
Li, Qing
Zhang, Yingjie
Wen, Hai-Hu
contents By using the pulsed-laser-ablation technique, we have successfully grown the La$_{3}$Ni$_{2}$O$_{7-δ}$ thin films with $c$-axis orientation perpendicular to the film surface. X-ray diffraction shows that the (00l) peaks can be well indexed to the La$_{3}$Ni$_{2}$O$_{7-δ}$ phase. Resistive measurements show that the samples can be tuned from weak insulating to metallic behavior through adjusting the growth conditions. Surprisingly, all curves of $ρ-T$ in the temperature region of 2$\sim$300~K do not show the anomalies corresponding to either the spin density wave or the charge density wave orders as seen in bulk samples. Hall effect measurements show a linear field dependence with the dominant hole charge carriers, but the Hall coefficient $R_{H}=ρ_{xy}/H$ exhibits strong temperature dependence. The magnetoresistance above about 50~K is positive but very weak, indicating a weakened or absence of multiband effect. However, a negative magnetoresistance is observed at low temperatures, which shows the delocalization effect by magnetic field. Detailed analysis on the magnetoresistance suggests that the delocalization effect at low temperatures is due to the Kondo-like effect, rather than the Anderson weak localization. Our transport results suggest that, the electronic conduction is fulfilled by the $d_{x^{2}-y^{2}}$ orbital with holes as the dominant charge carriers, while the interaction through Hund's coupling with the localized $d_{z^{2}}$ orbital plays an important role in the charge dynamics.
format Preprint
id arxiv_https___arxiv_org_abs_2406_08789
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Growth and characterization of the La$_{3}$Ni$_{2}$O$_{7-δ}$ thin films: dominant contribution of the $d_{x^{2}-y^{2}}$ orbital at ambient pressure
Liu, Yuecong
Ou, Mengjun
Chu, Haifeng
Yang, Huan
Li, Qing
Zhang, Yingjie
Wen, Hai-Hu
Superconductivity
By using the pulsed-laser-ablation technique, we have successfully grown the La$_{3}$Ni$_{2}$O$_{7-δ}$ thin films with $c$-axis orientation perpendicular to the film surface. X-ray diffraction shows that the (00l) peaks can be well indexed to the La$_{3}$Ni$_{2}$O$_{7-δ}$ phase. Resistive measurements show that the samples can be tuned from weak insulating to metallic behavior through adjusting the growth conditions. Surprisingly, all curves of $ρ-T$ in the temperature region of 2$\sim$300~K do not show the anomalies corresponding to either the spin density wave or the charge density wave orders as seen in bulk samples. Hall effect measurements show a linear field dependence with the dominant hole charge carriers, but the Hall coefficient $R_{H}=ρ_{xy}/H$ exhibits strong temperature dependence. The magnetoresistance above about 50~K is positive but very weak, indicating a weakened or absence of multiband effect. However, a negative magnetoresistance is observed at low temperatures, which shows the delocalization effect by magnetic field. Detailed analysis on the magnetoresistance suggests that the delocalization effect at low temperatures is due to the Kondo-like effect, rather than the Anderson weak localization. Our transport results suggest that, the electronic conduction is fulfilled by the $d_{x^{2}-y^{2}}$ orbital with holes as the dominant charge carriers, while the interaction through Hund's coupling with the localized $d_{z^{2}}$ orbital plays an important role in the charge dynamics.
title Growth and characterization of the La$_{3}$Ni$_{2}$O$_{7-δ}$ thin films: dominant contribution of the $d_{x^{2}-y^{2}}$ orbital at ambient pressure
topic Superconductivity
url https://arxiv.org/abs/2406.08789