Steuer, O., Schwarz, D., Oehme, M., Bärwolf, F., Cheng, Y., Ganss, F., . . . Prucnal, S. (2024). Structural changes in Ge1-xSnx and Si1-x-yGeySnx thin films on SOI substrates treated by pulse laser annealing.
Chicago Style (17th ed.) CitationSteuer, Oliver, et al. Structural Changes in Ge1-xSnx and Si1-x-yGeySnx Thin Films on SOI Substrates Treated by Pulse Laser Annealing. 2024.
MLA (9th ed.) CitationSteuer, Oliver, et al. Structural Changes in Ge1-xSnx and Si1-x-yGeySnx Thin Films on SOI Substrates Treated by Pulse Laser Annealing. 2024.
Warning: These citations may not always be 100% accurate.