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Structural changes in Ge1-xSnx and Si1-x-yGeySnx thin films on SOI substrates treated by pulse laser annealing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Steuer, Oliver, Schwarz, Daniel, Oehme, Michael, Bärwolf, Florian, Cheng, Yu, Ganss, Fabian, Hübner, René, Heller, René, Zhou, Shengqiang, Helm, Manfred, Cuniberti, Gianaurelio, Georgiev, Yordan M., Prucnal, Slawomir
Format:	Preprint
Published:	2024
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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