Copertina

Implementing dynamic high-performance computing supported workflows on Scanning Transmission Electron Microscope

Fuente: arXiv

Salvato in:

Dettagli Bibliografici
Autori principali:	Pratiush, Utkarsh, Houston, Austin, Kalinin, Sergei V, Duscher, Gerd
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Instrumentation and Detectors Materials Science Human-Computer Interaction
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

Documenti analoghi

Unsupervised Reward-Driven Image Segmentation in Automated Scanning Transmission Electron Microscopy Experiments
di: Barakati, Kamyar, et al.
Pubblicazione: (2024)

Building Workflows for Interactive Human in the Loop Automated Experiment (hAE) in STEM-EELS
di: Pratiush, Utkarsh, et al.
Pubblicazione: (2024)

Towards Self-Optimizing Electron Microscope: Robust Tuning of Aberration Coefficients via Physics-Aware Multi-Objective Bayesian Optimization
di: Pratiush, Utkarsh, et al.
Pubblicazione: (2026)

Practical Crystallography with a Transmission Electron Microscope
di: Weare, Benjamin L., et al.
Pubblicazione: (2025)

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
di: Zhang, Tianbi, et al.
Pubblicazione: (2024)

Autonomous X-ray Fluorescence Mapping of Chemically Heterogeneous Systems via a Correlative Feature Detection Framework
di: Deleon, Carlos, et al.
Pubblicazione: (2025)

Calibrating coordinate system alignment in a scanning transmission electron microscope using a digital twin
di: Weber, Dieter, et al.
Pubblicazione: (2024)

Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
di: Simonaitis, John W., et al.
Pubblicazione: (2024)

Scanning Transmission Electron Microscopy of Oxide Interfaces and Heterostructures
di: Spurgeon, Steven R.
Pubblicazione: (2020)

Point-Spread Function of the Optics in Scanning Electron Microscopes
di: Kamal, Surya, et al.
Pubblicazione: (2024)

Automating Nanoindentation: Optimizing Workflows for Precision and Accuracy
di: Chawla, Vivek, et al.
Pubblicazione: (2025)

Noise2Void for Denoising Atomic Resolution Scanning Transmission Electron Microscopy Images
di: Thornley, William, et al.
Pubblicazione: (2026)

BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization
di: Pattison, Alexander J., et al.
Pubblicazione: (2024)

Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
di: Pratiush, Utkarsh, et al.
Pubblicazione: (2025)

Design To Convert a Wired PLC into Wireless PLC
di: Ghildiyal, Sushil, et al.
Pubblicazione: (2024)

A Transformer-based Model for Rapid Microstructure Inference from Four-Dimensional Scanning Transmission Electron Microscopy Data
di: Je, Kwanghwi, et al.
Pubblicazione: (2026)

Open Gas-Cell Transmission Electron Microscopy at 50 pm Resolution
di: Biran, Idan, et al.
Pubblicazione: (2025)

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
di: Pattison, Alexander, et al.
Pubblicazione: (2023)

From Photons to Electrons: Accelerated Materials Discovery via Random Libraries and Automated Scanning Transmission Electron Microscopy
di: Slautin, Boris, et al.
Pubblicazione: (2026)

Nanoscale Three-Dimensional Imaging of Integrated Circuits using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer
di: Nakamura, Nathan, et al.
Pubblicazione: (2022)

High Dynamic Range Scanning Tunneling Microscopy
di: Karić, Ajla, et al.
Pubblicazione: (2024)

Adding Radio Frequency Capabilities to a millikelvin Scanning Tunneling Microscope
di: Marbey, Jonathan, et al.
Pubblicazione: (2025)

True Alternating Current Scanning Tunneling Microscope (ACSTM): tunneling on insulators
di: Rost, M. J.
Pubblicazione: (2026)

Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
di: Ma, Desheng, et al.
Pubblicazione: (2024)

In-situ Transmission Kikuchi Diffraction Tensile Testing
di: Vermeij, Tijmen, et al.
Pubblicazione: (2024)

Feed-forward active magnetic shielding
di: de Cheveigné, Alain
Pubblicazione: (2024)

Reward driven workflows for unsupervised explainable analysis of phases and ferroic variants from atomically resolved imaging data
di: Barakati, Kamyar, et al.
Pubblicazione: (2024)

Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping
di: Sendra, Joan, et al.
Pubblicazione: (2023)

Reward based optimization of resonance-enhanced piezoresponse spectroscopy
di: Liu, Yu, et al.
Pubblicazione: (2024)

Methods for an Electron Emission Digital Twin
di: Carceles, Salvador Barranco, et al.
Pubblicazione: (2026)

Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns
di: Britton, Ben, et al.
Pubblicazione: (2025)

Drift Correction of Scan Images by Snapshot Referencing
di: Thollar, Zac, et al.
Pubblicazione: (2026)

AstroECP: towards more practical Electron Channeling Contrast Imaging
di: Qaiser, M. Haroon, et al.
Pubblicazione: (2025)

Deep Learning Enabled Nanoscale X-ray Photoemission Electron Microscopy (nanoXPEEM)
di: Mishra, Aashwin, et al.
Pubblicazione: (2025)

Thermal/epithermal neutron detection via LiO$_{2}$-doped fiber bundles: A computational study through GEANT4 simulations
di: Topuz, A. Ilker, et al.
Pubblicazione: (2024)

Revealing Information from Weak Signal in Electron Energy-Loss Spectroscopy with a Deep Denoiser
di: Wang, Yifan, et al.
Pubblicazione: (2025)

A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM
di: El-Khairaoui, Nohayla, et al.
Pubblicazione: (2026)

AIMD-L: An automated laboratory for high-throughput characterization of structural materials for extreme environments
di: Hufnagel, Todd C., et al.
Pubblicazione: (2026)

afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy
di: Sullivan, Nicholas J., et al.
Pubblicazione: (2025)

Multi-Mode Lens for Momentum Microscopy and XPEEM: Theory
di: Tkach, Olena, et al.
Pubblicazione: (2024)