Measurement of exciton fraction of microcavity exciton-polaritons using transfer-matrix modeling

Fuente: arXiv
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Autores principales: Beaumariage, Jonathan, Sun, Zheng, Alnatah, Hassan, Yao, Qi, Myers, David M., Steger, Mark, West, Ken, Baldwin, Kirk, Pfeiffer, Loren N., Tam, Man Chun Alan, Wailewski, Zbig R., Snoke, David W.
Formato: Preprint
Publicado: 2024
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author Beaumariage, Jonathan
Sun, Zheng
Alnatah, Hassan
Yao, Qi
Myers, David M.
Steger, Mark
West, Ken
Baldwin, Kirk
Pfeiffer, Loren N.
Tam, Man Chun Alan
Wailewski, Zbig R.
Snoke, David W.
author_facet Beaumariage, Jonathan
Sun, Zheng
Alnatah, Hassan
Yao, Qi
Myers, David M.
Steger, Mark
West, Ken
Baldwin, Kirk
Pfeiffer, Loren N.
Tam, Man Chun Alan
Wailewski, Zbig R.
Snoke, David W.
contents We present a careful calibration of the exciton fraction of polaritons in high-$Q$ ($\sim 300,000$), long-lifetime ($\sim 300$ ps), GaAs/AlGaAs microcavities.This is a crucial parameter for many-body theories which include the polariton-polariton interactions.It is much harder to establish this number in high-$Q$ structures compared to low-$Q$ structures, because the upper polariton is nearly invisible in high-$Q$ cavities.We present a combination of photoluminescence, photoluminescence excitation, and reflectivity measurements to highly constrain the fit model, and compare the results of this model to the results from low-$Q$ structures.We present a fitted curve of exciton fraction as a function of the lower polariton energy for multiple samples which have been used in prior experiments.
format Preprint
id arxiv_https___arxiv_org_abs_2406_12940
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Measurement of exciton fraction of microcavity exciton-polaritons using transfer-matrix modeling
Beaumariage, Jonathan
Sun, Zheng
Alnatah, Hassan
Yao, Qi
Myers, David M.
Steger, Mark
West, Ken
Baldwin, Kirk
Pfeiffer, Loren N.
Tam, Man Chun Alan
Wailewski, Zbig R.
Snoke, David W.
Mesoscale and Nanoscale Physics
Quantum Gases
We present a careful calibration of the exciton fraction of polaritons in high-$Q$ ($\sim 300,000$), long-lifetime ($\sim 300$ ps), GaAs/AlGaAs microcavities.This is a crucial parameter for many-body theories which include the polariton-polariton interactions.It is much harder to establish this number in high-$Q$ structures compared to low-$Q$ structures, because the upper polariton is nearly invisible in high-$Q$ cavities.We present a combination of photoluminescence, photoluminescence excitation, and reflectivity measurements to highly constrain the fit model, and compare the results of this model to the results from low-$Q$ structures.We present a fitted curve of exciton fraction as a function of the lower polariton energy for multiple samples which have been used in prior experiments.
title Measurement of exciton fraction of microcavity exciton-polaritons using transfer-matrix modeling
topic Mesoscale and Nanoscale Physics
Quantum Gases
url https://arxiv.org/abs/2406.12940