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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2406.13171 |
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| _version_ | 1866929733146509312 |
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| author | Zhu, Bingbing Cai, Qingnan Liu, Yaxin Zhang, Sheng Liu, Weifeng He, Qiong Zhou, Lei Tao, Zhensheng |
| author_facet | Zhu, Bingbing Cai, Qingnan Liu, Yaxin Zhang, Sheng Liu, Weifeng He, Qiong Zhou, Lei Tao, Zhensheng |
| contents | All-dielectric optical nano-resonators, exhibiting exotic near-field distributions upon excitations, have emerged as low-loss, versatile and highly adaptable components in nanophotonic structures for manipulating electromagnetic waves and enhancing light-matter interactions. However, achieving experimental full three-dimensional characterization of near-fields within dielectric nano-resonators poses significant challenges. Here, we develop a novel technique using high-order sideband generation to image near-field wave patterns inside dielectric optical nano-resonators. By exploiting the phase-sensitivity of various harmonic orders that enables the detection of near-field distributions at distinct depths, we achieve three-dimensional tomographic and near-field imaging with nanometer resolution inside a micrometer-thick silicon anapole resonator. Furthermore, our method offers high-contrast polarization sensitivity and phase-resolving capability, providing comprehensive vectorial near-field information. Our approach can potentially be applied to diverse dielectric metamaterials, and becomes a valuable tool for comprehensive characterization of near-field wave phenomena within dielectric materials. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2406_13171 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Nanometer-resolution 3D Tomographic and Vectorial Near-field Imaging in Dielectric Optical Resonators Zhu, Bingbing Cai, Qingnan Liu, Yaxin Zhang, Sheng Liu, Weifeng He, Qiong Zhou, Lei Tao, Zhensheng Optics All-dielectric optical nano-resonators, exhibiting exotic near-field distributions upon excitations, have emerged as low-loss, versatile and highly adaptable components in nanophotonic structures for manipulating electromagnetic waves and enhancing light-matter interactions. However, achieving experimental full three-dimensional characterization of near-fields within dielectric nano-resonators poses significant challenges. Here, we develop a novel technique using high-order sideband generation to image near-field wave patterns inside dielectric optical nano-resonators. By exploiting the phase-sensitivity of various harmonic orders that enables the detection of near-field distributions at distinct depths, we achieve three-dimensional tomographic and near-field imaging with nanometer resolution inside a micrometer-thick silicon anapole resonator. Furthermore, our method offers high-contrast polarization sensitivity and phase-resolving capability, providing comprehensive vectorial near-field information. Our approach can potentially be applied to diverse dielectric metamaterials, and becomes a valuable tool for comprehensive characterization of near-field wave phenomena within dielectric materials. |
| title | Nanometer-resolution 3D Tomographic and Vectorial Near-field Imaging in Dielectric Optical Resonators |
| topic | Optics |
| url | https://arxiv.org/abs/2406.13171 |