Measurement of the Crystallization and Phase Transition of Niobium Dioxide Thin-Films for Neuromorphic Computing Applications Using a Tube Furnace Optical Transmission System

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Hauptverfasser: Robinson, Zachary R., Beckmann, Karsten, Michels, James, Daviero, Vincent, Street, Elizabeth A., Lorenzen, Fiona, Sullivan, Matthew C., Cady, Nathaniel, Kozen, Alexander, Currie, Marc
Format: Preprint
Veröffentlicht: 2024
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author Robinson, Zachary R.
Beckmann, Karsten
Michels, James
Daviero, Vincent
Street, Elizabeth A.
Lorenzen, Fiona
Sullivan, Matthew C.
Cady, Nathaniel
Kozen, Alexander
Currie, Marc
author_facet Robinson, Zachary R.
Beckmann, Karsten
Michels, James
Daviero, Vincent
Street, Elizabeth A.
Lorenzen, Fiona
Sullivan, Matthew C.
Cady, Nathaniel
Kozen, Alexander
Currie, Marc
contents Significant research has focused on low-power stochastic devices built from memristive materials. These devices foster neuromorphic approaches to computational efficiency enhancement in merged biomimetic and CMOS architectures due to their ability to phase transition from a dielectric to a metal at an increased temperature. Niobium dioxide has a volatile memristive phase change that occurs $\sim$800$^\circ$C~that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for \emph{in situ} spectral measurements as an as-grown \NbtOf\ film is annealed and ultimately crystallizes as \NbOt. The system measures the changing spectral transmissivity of \NbtOf\ as it undergoes both reduction and crystallization processes. We were also able to measure the transition from metallic-to-non-metallic \NbOt\ during the cooldown phase, which is shown to occur about 100$^\circ$C~ lower on a sapphire substrate than fused silica. After annealing, the material properties of the \NbtOf\ and \NbOt\ were assessed via X-ray photoelectron spectroscopy, X-ray diffraction, and 4-point resistivity, confirming that we have made crystalline \NbOt.
format Preprint
id arxiv_https___arxiv_org_abs_2406_13523
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Measurement of the Crystallization and Phase Transition of Niobium Dioxide Thin-Films for Neuromorphic Computing Applications Using a Tube Furnace Optical Transmission System
Robinson, Zachary R.
Beckmann, Karsten
Michels, James
Daviero, Vincent
Street, Elizabeth A.
Lorenzen, Fiona
Sullivan, Matthew C.
Cady, Nathaniel
Kozen, Alexander
Currie, Marc
Applied Physics
Materials Science
Emerging Technologies
Significant research has focused on low-power stochastic devices built from memristive materials. These devices foster neuromorphic approaches to computational efficiency enhancement in merged biomimetic and CMOS architectures due to their ability to phase transition from a dielectric to a metal at an increased temperature. Niobium dioxide has a volatile memristive phase change that occurs $\sim$800$^\circ$C~that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for \emph{in situ} spectral measurements as an as-grown \NbtOf\ film is annealed and ultimately crystallizes as \NbOt. The system measures the changing spectral transmissivity of \NbtOf\ as it undergoes both reduction and crystallization processes. We were also able to measure the transition from metallic-to-non-metallic \NbOt\ during the cooldown phase, which is shown to occur about 100$^\circ$C~ lower on a sapphire substrate than fused silica. After annealing, the material properties of the \NbtOf\ and \NbOt\ were assessed via X-ray photoelectron spectroscopy, X-ray diffraction, and 4-point resistivity, confirming that we have made crystalline \NbOt.
title Measurement of the Crystallization and Phase Transition of Niobium Dioxide Thin-Films for Neuromorphic Computing Applications Using a Tube Furnace Optical Transmission System
topic Applied Physics
Materials Science
Emerging Technologies
url https://arxiv.org/abs/2406.13523