Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy
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arXiv
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| Main Authors: | , , , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866916295789772800 |
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| author | Cattaneo, Mauricio Müller-Caspary, Knut Barthel, Juri Mac Arthur, Katherine E. Gauquelin, Nicolas Lipinska-Chwalek, Marta Verbeeck, Johan Allen, Leslie J. Dunin-Borkowski, Rafal E. |
| author_facet | Cattaneo, Mauricio Müller-Caspary, Knut Barthel, Juri Mac Arthur, Katherine E. Gauquelin, Nicolas Lipinska-Chwalek, Marta Verbeeck, Johan Allen, Leslie J. Dunin-Borkowski, Rafal E. |
| contents | Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM (STEM) data to determine the local mistilt from a major zone axis. It is based on a geometric analysis of Kikuchi bands within a single diffraction pattern, yielding the centre of the Laue circle. Whereas the approach is not limited to convergent illumination, it is here developed using unit-cell averaged diffraction patterns corresponding to high-resolution STEM settings. In simulation studies, an accuracy of approximately 0.1mrad is found. The method is implemented in automated software and applied to crystallographic tilt and in-plane rotation mapping in two experimental cases. In particular, orientation maps of high-Mn steel and an epitaxially grown La$_{\text{0.7}}$Sr$_{\text{0.3}}$MnO$_{\text{3}}$-SrTiO$_{\text{3}}$ interface are presented. The results confirm the estimates of the simulation study and indicate that tilt mapping can be performed consistently over a wide field of view with diameters well above 100nm at unit cell real space sampling. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2406_14151 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy Cattaneo, Mauricio Müller-Caspary, Knut Barthel, Juri Mac Arthur, Katherine E. Gauquelin, Nicolas Lipinska-Chwalek, Marta Verbeeck, Johan Allen, Leslie J. Dunin-Borkowski, Rafal E. Materials Science Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM (STEM) data to determine the local mistilt from a major zone axis. It is based on a geometric analysis of Kikuchi bands within a single diffraction pattern, yielding the centre of the Laue circle. Whereas the approach is not limited to convergent illumination, it is here developed using unit-cell averaged diffraction patterns corresponding to high-resolution STEM settings. In simulation studies, an accuracy of approximately 0.1mrad is found. The method is implemented in automated software and applied to crystallographic tilt and in-plane rotation mapping in two experimental cases. In particular, orientation maps of high-Mn steel and an epitaxially grown La$_{\text{0.7}}$Sr$_{\text{0.3}}$MnO$_{\text{3}}$-SrTiO$_{\text{3}}$ interface are presented. The results confirm the estimates of the simulation study and indicate that tilt mapping can be performed consistently over a wide field of view with diameters well above 100nm at unit cell real space sampling. |
| title | Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy |
| topic | Materials Science |
| url | https://arxiv.org/abs/2406.14151 |