Stress-Dependent Optical Extinction in LPCVD Silicon Nitride Measured by Nanomechanical Photothermal Sensing

Fuente: arXiv
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Bibliographic Details
Main Authors: Kanellopulos, Kostas, West, Robert G., Emminger, Stefan, Martini, Paolo, Sauer, Markus, Foelske, Annette, Schmid, Silvan
Format: Preprint
Published: 2024
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