PlagBench: Exploring the Duality of Large Language Models in Plagiarism Generation and Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lee, Jooyoung, Agrawal, Toshini, Uchendu, Adaku, Le, Thai, Chen, Jinghui, Lee, Dongwon
Format:	Preprint
Published:	2024
Subjects:	Computation and Language
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.16288