Magnetic Force Microscopy: High Quality-Factor Two-Pass Mode

Fuente: arXiv

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Bibliographic Details
Main Authors:	Habenschaden, Christopher, Sievers, Sibylle, Klasen, Alexander, Cerreta, Andrea, Schumacher, Hans Werner
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.17664