Towards Reducing Data Acquisition and Labeling for Defect Detection using Simulated Data

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kemeter, Lukas Malte, Hvingelby, Rasmus, Sierak, Paulina, Schön, Tobias, Gosswam, Bishwajit
Format:	Preprint
Published:	2024
Subjects:	Machine Learning Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.19175