MulTi-Wise Sampling: Trading Uniform T-Wise Feature Interaction Coverage for Smaller Samples

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pett, Tobias, Krieter, Sebastian, Thüm, Thomas, Schaefer, Ina
Format:	Preprint
Published:	2024
Subjects:	Software Engineering Machine Learning D.2
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2406.19801