SAFT: Towards Out-of-Distribution Generalization in Fine-Tuning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Nguyen, Bac, Uhlich, Stefan, Cardinaux, Fabien, Mauch, Lukas, Edraki, Marzieh, Courville, Aaron
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.03036