Amplitude-noise-resilient entangling gates for trapped ions

Fuente: arXiv
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Bibliographic Details
Main Authors: Le, Nguyen H., Orozco-Ruiz, Modesto, Kulmiya, Sahra A., Urquhart, James G., Hile, Samuel J., Hensinger, Winfried K., Mintert, Florian
Format: Preprint
Published: 2024
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